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『簡體書』先进电子封Modeling,Analysis,Design and Tests for Electronics Packaging beyond Moore(超摩尔时代电子封装建模、分析、设计与测试)

書城自編碼: 3628070
分類: 簡體書→大陸圖書→工業技術一般工业技术
作者: 张恒运,车法星,林挺宇,赵文生 著
國際書號(ISBN): 9787122379528
出版社: 化学工业出版社
出版日期: 2021-03-01

頁數/字數: /
書度/開本: 16开 釘裝: 精装

售價:NT$ 2308

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編輯推薦:
本书具有以下创新点:1.率先将多孔介质理论用于电子封装的热模拟分析,用于处理复杂的封装组件,如具有外绝缘层的TSV结构、微焊点和焊球阵列、具有多层结构和多种微通孔的基层,RDL层等,并应用于封装系统性能分析,可以有效解决封装热模拟仿真问题,大大缩短计算时间,并具有良好的模拟精度。
?2. 持续研究了3D芯片堆叠封装的热性能极限。随着3D封装的发热量上升,单纯的自然对流或者冷板技术不能实现有效热管理,采用直接液冷技术、或者背部微槽道液冷才能大幅度提高热设计功率,从而实现更高的芯片性能。
?3. 在新材料方面,作者引入碳纳米管作为3D互联TSV技术,分析其热性能和电性能,指出采用碳纳米管互联可以去除微焊点层,提高堆叠芯片之间的散热性能,从而缓解甚至消除热管理危机。同时,也对采用石墨烯、金刚石作为热扩散材料进行了阐述。
?4. 在可靠性测试与分析方面,内容涵盖了封装材料的本构模型及材料参数,广泛的可靠性试验及分析,如热循环,机械振动与冲击,机械循环弯曲,电源重复启闭,电子迁移等试验及分析技巧。
?5. 在多物理场耦合分析方面,针对高功率射频放大器的微冷却器进行了综合分析,包括工艺流程
內容簡介:
本书系统介绍了超摩尔时代先进封装理论模型、分析与新的模拟结果。内容涉及2.5D、3D、晶圆级封装的电性能、热性能、热机械性能、散热问题、可靠性问题、电气串扰等问题,提出了基于多孔介质体积平均理论的建模方法并应用于日渐复杂的先进封装结构,以及模型验证、设计和测试,并从原理到应用对封装热传输进行了很好的介绍。同时,引入并分析了碳纳米管、金刚石镀层、石墨烯等新材料的应用性能。本书针对产品开发阶段封装的热管理和应力管理方面进行了详细阐述,在封装性能测试、蒸汽层散热器、微槽道冷却、热电制冷等方面也有涉及。相应的试验测试和案例分析也便于读者提高对封装性能表征和评估方法的理解。
本书可作为从事微电子封装行业人员的参考资料,也可供高等院校相关专业研究生和高年级本科生学习参考。
關於作者:
张恒运,上海工程技术大学教授,博士生导师,IEEE高级会员。曾任职于新加坡微电子研究院,美国超微半导体公司(新加坡)、美国道康宁公司(上海)。主持和参与新加坡先进科技局、美国DARPA、上海科委、自然科学基金、跨国公司项目近20项,发表论文80多篇,GOOGLE Scholar引用率1000次。授予美国、新加坡发明专利和中国发明、实用新型专利共30多项。

车法星,新加坡微电子研究院研究员。曾就职于UTAC,意法半导体,英飞凌公司。发表论文120多篇,Google Scholar引用率近2000次。

林挺宇,无锡华进半导体研究所技术总监。曾任职于朗讯、飞利浦、摩托罗拉等公司和微电子研究院担任高级经理等职务,参与超过100项电子产品开发工作,发表论文150多篇,申请、授予专利10多项,主导两项关于TSV的ASTM国际标准。

赵文生,IEEE高级会员,杭州电子科技大学副教授,发表论文70多篇。
目錄
Preface vii

Acknowledgments xi

About the authors xiii

1Introduction 1
1.1Evolution of integrated circuit packaging 1
1.2Performance and design methodology for integrated circuit packaging 6
References 11
Further reading 12

2Electrical modeling and design 13
2.1Fundamental theory13
2.2Modeling, characterization, and design of through-silicon via packages 28
References 53

3Thermal modeling, analysis, and design 59
3.1Principles of thermal analysis and design 59
3.2Package-level thermal analysis and design 74
3.3Numerical modeling 89
3.4Package-level thermal enhancement 97
3.5Air cooling for electronic devices with vapor chamber configurations 101
3.6Liquid cooling for electronic devices 106
3.7Thermoelectric cooling 112
References 126

4Stress and reliability analysis for interconnects 131
4.1Fundamental of mechanical properties 131
4.2Reliability test and analysis methods 149
4.3Case study of design-for-reliability 227
References 239

5Reliability and failure analysis of encapsulated packages 245
5.1Typical integrated circuit packaging failure modes 245
5.2Heat transfer and moisture diffusion in plastics integrated circuit packages 245
5.3Thermal- and moisture-induced stress analysis 263
5.4Fracture mechanics analysis in integrated circuits package 270
5.5Reliability enhancement in PBGA package 282
References 290
Further reading 292

6Thermal and mechanical tests for packages and materials 293
6.1Package them叫tests 293
6.2Material mechanical test and characterization 306
References 322

7System-level modeling, analysis, and design 325
7.1System-level them叫modeling and design 325
7.2Mechanical modeling and design for microcooler system 348
7.3Codesign modeling and analysis for advanced packages 370
References 389

Appendix 1 Nomenclature 393

Appendix 2 Conversion factors 403

Index 405
內容試閱
The technical level and development scale of the integrated circuit (IC) industry is one of the important indicators to measure a country’s industrial competitiveness and comprehensive national strength, and is the source of modern economic development. The application of IC has already become routine in various industries, such as military satellites, radar, civilian automotive electronics, smart equipment, and consumer electronics, etc. At present, the IC industry has formed three major industrial chains of design, manufacturing and packaging testing, which have become the indispensable pillar in the IC industry.
IC packaging is an indispensable process in the IC industry, which is the bridge from chip to device and device to system. It is a key fundamental manufacturing part of the IC industry and a competitive commanding height for the core device manufacturing of the IC industry.
With the rapid development of IC technology, higher and higher requirements for miniaturization, multi-function, high reliability and low cost of electronic products are put forward. Facing this situation, the electronic packaging materials and technologies are undergoing rapid development, promoting lots of advanced packaging materials. Advanced electronic packaging materials and technologies are the core of IC packaging.
In order to promote the development of China’s advanced electronic packaging industry and meet the urgent needs of researchers ranged from teaching and scientific study to engineering developing in the field of electronic packaging, the editorial committee has invited famous specialists to write the Series on Advanced Electronic Packaging Technology and Key Materials in recent years (English version). The series includes: “Advanced Polyimide Materials”, “From LED to Solid State Lighting”, “Freeform Optics for LED Packages and Applications”, “Modeling, Analysis, Design and Tests for Electronics Packaging beyond Moore”, “TSV(through-silicon via technology) Package” etc.
This series of books systematically describes the advanced electronic packaging from three aspects: advanced packaging materials, advanced packaging technologies and advanced packaging simulation design methods. This series covers the most advanced packaging materials such as polyimide materials and packaging technologies such as freeform optical technology, TSV(through-silicon via technology) packaging, and advanced packaging simulation design methods such as multi-physics analysis and applications. In addition, this series also makes a planning outlook and forecast for the development trend of advanced electronic packaging.
This series of books is of great worth for workers engaged in scientific research, production and application in electronic packaging and related industries, and also has great reference significance to teachers and students of related majors in higher education institutions.
We believe that the publication of this series of books will play a positive role in promoting the development of China’s IC industry and advanced electronic packaging industry.
Finally, we would like to express our sincere gratitude to our colleagues who have worked hard in the preparation of this series. We also express our heartfelt thanks to those who participated in organizing the publication of this series!

C.P.
IEEE Fellow
Member of Academy of Engineering of the USA
Member of Chinese Academy of Engineering
Former Bell Labs Fellow
Dean of Engineering, The Chinese University of Hong Kong
Regents’ Professor, Georgia Institute of Technology, Atlanta, GA 30332, USA
Sheng Liu, Ph.D.
IEEE Fellow, ASME Fellow
Chang Jiang Scholar Professor
Dean, School of Power and Mechanical Engineering,
Executive Director, Institute of Technological Sciences,
Wuhan University,
Wuhan, Hubei, China
Wenhui Zhu, Ph.D.
National Invited Professor
College of Mechanical and Electrical Engineering,
Central South University
Changsha, Hunan, China

 

 

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