新書推薦:
《
敢为天下先:三年建成港科大
》
售價:NT$
352.0
《
直观的经营:哲学视野下的动态管理
》
售價:NT$
407.0
《
长高食谱 让孩子长高个的饮食方案 0-15周岁儿童调理脾胃食谱书籍宝宝辅食书 让孩子爱吃饭 6-9-12岁儿童营养健康食谱书大全 助力孩子身体棒胃口好长得高
》
售價:NT$
214.0
《
身体自愈力:解决内在病因的身体智慧指南
》
售價:NT$
449.0
《
非言语沟通经典入门:影响人际交往的重要力量(第7版)
》
售價:NT$
560.0
《
山西寺观艺术壁画精编卷
》
售價:NT$
7650.0
《
中国摄影 中式摄影的独特魅力
》
售價:NT$
4998.0
《
山西寺观艺术彩塑精编卷
》
售價:NT$
7650.0
內容簡介:
Characterization in Optica Materias provides information for understanding the properties and performance of optical materials under the influence of the various characterization techniques. Surface and interfacial properties are key to the optical response of a material, and their control and modification during materials processing is necessary to achieve desired behavior. Characterization of Optica Materias focuses on how surface morphology, microstructure, and chemical bonding influence the optical response of a material, and it illuminates methods used to characterize thin films, multilayer structures, and modified surfaces,
目錄 :
PrefacetotheReissueoftheMaterialsCharacterizationSeries
PrefacetoSeries
PrefacetotheReissueofCharacterizationofOpticalMaterials
Preface
Contributors
INTRODUCTION
PART1INFLUENCEOFSURFACEMORPHOLOGYAND
MICROSTRUCTUREONOPTICALRESPONSE
CHARACTERIZATIONOFSURFACEROUGHNESS
1.1Introduction
1.2WhatSurfaceRoughnessls
1.3HowSurfaceRoughnessAffctsOpticaIMeasurements
1.4HowSurfaceRoughnessandScatteringAreMeasured
1.5CharacterizationofSelectedSurfaces
1.6FutureDifections
CHARACTERIZATIONOFTHENEAR-SURFACEREGIONUSINGPOIARIZATION-SENSITIVEOPTICALTECHNIQUES
2.1Introduction
2.2Ellipsometry
ExperimentallmplementationsofEllipsometry29,Analysisof
EllipsometryData
2.3MicrostructuralDeterminationsfromEllipsometryData
TemperatureDependenceoftheOpticatPropertiesofSilicon34,
DeterminationoftheOpticalFunctionsofGlassesUsingSE35,
SpectroscopicEllipsometryStudiesofSi02Si37,Spectroscopic
EllipsometryforComplicatedFilmStrucrures38,Time-Resolved
Ellipsometry40,Single-WavelengthReal-TimeMonitoringofFilm
Growth41,Multiple-WavelengthReal-TimeMonitoringofFilm
Growth42,InfraredEllipsometryStudiesofFilmGrowth
THECOMPOSITION,STOICHIOMETRY,ANDRELATEDMICROSTRUCTUREOFOPTICALMATERIALS
3.1Introduction
3.2AspectsofRamanScattering
3.3III-VSemiconductorSystems
3.4GroupIVMaterials
3.5AmorphousandMicrocrystallineSemiconductors
ChalcogenideGlasses60,GroupIVMicrocrystallineSemiconductors
3.6Summary
DIAMONDASANOPTICALMATERIAL
4.1Introduction
4.2DepositionMethods
4.30pticalPropertiesofCVDDiamond
4.4DefectsinCVDDiamond
4.5PolishingCVDDiamond
4.6X-rayWindow
4.7Summary
PART2STABILITYANDMODIFICATIONOFFILMANDSURFACEOPTICALPROPERTIES
MULTIJAYEROPTICALCOATINGS
5.1Introduction
5.2Single-LayerOpticalCoatings
OpticaIConstants90,CompositionMeasurementTechniques
5.3MultilayerOpticalCoatings
CompositionaIAnalysis107,SurfaceAnalyticaITechniques108,
MicrostructuralAnalysisofMultilayerOpticalCoatings
5.4StabilityofMultilayerOpticalCoatings
5.5FutureCompositionaland
MicrostructuralAnalyticaITechniques
CHARACTERIZATIONANDCONTROLOFSTRESSINOPTICALFILMS
6.1Introduction
6.20riginsofStress
……