Preface to the Reissue of the Materials Characterization Series
Preface to Series
Preface to the Reissue of Characterization of Metals andAlloys
Preface
Acronyms Glossary
Contributors
INTRODUCTION
1.1 Purpose and Organization of the Book
MECHANICAL PROPERTIES AND INTERFACIAL ANALYSIS
2.1 Introduction
2.2 Grain Boundary Segregation
2.3 Temper Embrittlement
2.4 Corrosion and Stress Corrosion Cracking
2.5 Hydrogen Embrittlement
2.6 Creep Embrittlement
2.7 Future Directions
CHEMICAL PROPERTIES
3.1 Introduction
3.2 Tools of the Trade--Unique Information Available
3.3 Gaseous Corrosion
3.4 Aqueous Corrosion
3.5 Surface Electronic Structure and Chemistry
3.6 Surface Modification
3.7 Summary
SURFACE AND THIN FILM ANALYSIS OF DIFFUSION IN METALS
4.1 Introduction
4.2 The Mathematics of Diffusion
4.3 Effects of Non-Uniform Cross Sections
4.4 Effects of Finite Thickness
4.5 Analysis Techniques for Diffusion
4.6 Case Studies of Diffusion
4.7 Summary
MINERAL PROCESSING AND METAL RECLAMATION
5.1 Introduction
5.2 Techniques for Mineral Surface Characterization
5.3 Surface Bonding in Mineral-Fluid Systems
5.4 Complementary Composition Analyses of Rough and Polished Surfaces
5.5 Summary
MELTING AND CASTING
6.1 Introduction
6.2 Aluminum-Lithium Alloys
6.3 Aluminum-Magnesium Alloys
6.4 Rapidly Solidified Aluminum Alloy Powders
6.5 Cast Aluminum Alloy Metal Matrix Composites
6.6 Liquid Aluminum Alloys
6.7 Summary
MACHINING AND WORKING OF METALS
7.1 Introduction
7.2 Physical and Chemical Characterization
7.3 Lubrication
7.4 Surface Finish
7.5 Metalworking Example
7.6 Summary
CHARACTERIZATION OF THE CLEANING OF SURFACES OF METALS AND METAL ALLOYS
8.1 Introduction
8.2 Characterization of Cleaning Procedures
8.3 Specimen Handling and Interpretation of Data
8.4 Summary
COATINGS AND THIN FILMS
9.1 Introduction
9.2 Techniques for Creating Coatings and Thin Films
9.3 Techniques to Characterize Coatings and Thin Films
9.4 Studies of Coatings on Metals
9.5 Studies of Thin Films on Metals
9.6 Summary
FAILURE ANALYSIS
10.1 Introduction
10.2 Collaboration with the Applications Engineering Team
10.3 Failure Analysis Case Histories
10.4 Summary
APPENDIX: TECHNIQUE SUMMARIES
1 Auger Electron Spectroscopy AES
2 Cathodoluminescence CL
3 Dynamic Secondary Ion Mass Spectrometry Dynamic SIMS
4 Elastic Recoil Spectrometry ERS
5 Electron Energy-Loss Spectroscopy in the Transmission Electron Microscope EELS
6 Electron Probe X-Ray Microanalysis EPMA
7 Energy-Dispersive X-Ray Spectroscopy EDS
8 Extended X-Ray Absorption Fine Structure EXAFS
9 Field Ion Microscopy FIM
10 Fourier Transform Infrared Spectroscopy FTIR
11 Glow-Discharge Mass Spectrometry GDMS
12 High-Resolution Electron Energy Loss Spectroscopy HREELS
13 Inductively Coupled Plasma Mass Spectrometry ICPMS
14 Inductively Coupled Plasma-Optical Emission SpectroscopyICP-OES
15 Ion Scattering Spectroscopy ISS
16 Laser Ionization Mass Spectrometry LIMS
17 Low-Energy Electron Diffraction LEED
18 Low-Energy Electron Microscopy LEEM
19 Magneto-Optic Kerr Effect MOKE
20 Medium-Energy Ion Scattering with Channeling and Blocking MEIS
21 Neutron Activation Analysis NAA
22 Nuclear Reaction Analysis NRA
23 Optical Micro-Reflectometry OMR and Differential Reflectometry DR
24 Optical Second Harmonic Generation SHG
25 Particle-Induced X-Ray Emission PIXE
26 Photoacoustic Spectroscopy PAS
27 Photoelectron Emission Microscopy PEEM
28 Photoluminescence PL
29 Reflected Electron Energy-Loss Spectroscopy REELS
30 Reflection High-Energy Electron Diffraction RHEED
31 Rutherford Backscattering Spectrometry RBS
32 Scanning Electron Microscopy SEM
33 Scanning Transmission Electron Microscopy STEM
34 Scanning Tunneling Microscopy and Scanning Force MicroscopySTM and SFM
35 Solid State Nuclear Magnetic Resonance NMR
36 Spark Source Mass Spectrometry SSMS
37 Sputtered Neutral Mass Spectrometry SNMS
38 Static Secondary Ion Mass Spectrometry Static SIMS
39 Surface Analysis by Laser Ionization SALI
40 Surface Extended X-Ray Absorption Fine Structure and Near Edge X-Ray Absorption Fine Structure SEXAFSNEXAFS
41 Temperature Programmed Desorption TPD
42 Total Reflection X-Ray Fluorescence Analysis TXRF
43 Transmission Electron Microscopy TEM
44 Ultraviolet Photoelectron Spectroscopy UPS
45 Variable-Angle Spectroscopic Ellipsometry VASE
46 X-Ray Diffraction XRD
47 X-Ray Fluorescence XRF
48 X-Ray Photoelectron and Auger Electron Diffraction XPD and AED
49 X-Ray Photoelectron Spectroscopy XPS
Index
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